Patent
   D314347
Priority
May 25 1988
Filed
Oct 28 1988
Issued
Feb 05 1991
Expiry
Feb 05 2005
Assg.orig
Entity
unknown
2
19
n/a
The ornamental design for a measuring center, as shown.

FIG. 1 is a top, front, right side and perspective view of a measuring center showing my new design;

FIG. 2 is a left side elevational view;

FIG. 3 is a right side elevational view;

FIG. 4 is a front elevational view;

FIG. 5 is a rear elevational view; and

FIG. 6 is a bottom plan view thereof.

The bottom is plain and unornamented.

Garnich, Rolf, Band, Gerhard, Ross, Gunther

Patent Priority Assignee Title
D323628, Apr 25 1989 Tokyo Electron Limited Semiconductor wafer measuring instrument
D335088, Apr 22 1991 Giddings & Lewis, LLC Coordinate measuring machine with covers
Patent Priority Assignee Title
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4833789, May 27 1986 D.E.A. Digital Electronic Automation S.p.A. Coordinate-measuring machine
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Executed onAssignorAssigneeConveyanceFrameReelDoc
Sep 28 1988BAND, GERHARDMauser-Werke Oberndorf GmbHASSIGNMENT OF ASSIGNORS INTEREST 0049700713 pdf
Sep 28 1988ROSS, GUNTHERMauser-Werke Oberndorf GmbHASSIGNMENT OF ASSIGNORS INTEREST 0049700713 pdf
Sep 29 1988GARNICH, ROLFMauser-Werke Oberndorf GmbHASSIGNMENT OF ASSIGNORS INTEREST 0049700713 pdf
Oct 28 1988Mauser-Werke Oberndorf GmbH(assignment on the face of the patent)
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