Patent
   D383683
Priority
Apr 25 1996
Filed
Apr 25 1996
Issued
Sep 16 1997
Expiry
Sep 16 2011
Assg.orig
Entity
unknown
1
4
n/a
The ornamental design for wafer prober, as shown.

FIG. 1 is a top/front/left side perspective view of a wafer prober showing our new design;

FIG. 2 is a top/front/left side perspective view thereof with a front cover open;

FIG. 3 is a front view thereof;

FIG. 4 is a top view thereof;

FIG. 5 is a right side view thereof;

FIG. 6 is a back view thereof;

FIG. 7 is a left side view thereof; and,

FIG. 8 is a bottom view thereof.

Nagasaka, Munetoshi, Sugiyama, Masahiko, Yoshioka, Haruhiko, Yamagata, Kazumi, Kamata, Osamu

Patent Priority Assignee Title
D642941, Dec 22 2009 Robert Bosch GmbH Test bench
Patent Priority Assignee Title
5107206, May 25 1990 Tescon Co., Ltd. Printed circuit board inspection apparatus
5506512, Nov 25 1993 Tokyo Electron Limited Transfer apparatus having an elevator and prober using the same
D264873, Jun 16 1980 CLINICAL DIAGNOSTIC SYSTEMS INC Chemical analyzer
D350490, Oct 08 1992 TOKYO ELELCTRON KABUSHIKI KAISHA Semiconductor wafer testing apparatus
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Executed onAssignorAssigneeConveyanceFrameReelDoc
Apr 25 1996Tokyo Electron Limited(assignment on the face of the patent)
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