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The ornamental design for wafer prober, as shown. |
FIG. 1 is a top/front/left side perspective view of a wafer prober showing our new design;
FIG. 2 is a top/front/left side perspective view thereof with a front cover open;
FIG. 3 is a front view thereof;
FIG. 4 is a top view thereof;
FIG. 5 is a right side view thereof;
FIG. 6 is a back view thereof;
FIG. 7 is a left side view thereof; and,
FIG. 8 is a bottom view thereof.
Nagasaka, Munetoshi, Sugiyama, Masahiko, Yoshioka, Haruhiko, Yamagata, Kazumi, Kamata, Osamu
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Executed on | Assignor | Assignee | Conveyance | Frame | Reel | Doc |
Apr 25 1996 | Tokyo Electron Limited | (assignment on the face of the patent) | / |
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