Patent
   D642941
Priority
Dec 22 2009
Filed
May 26 2010
Issued
Aug 09 2011
Expiry
Aug 09 2025
Assg.orig
Entity
unknown
8
7
n/a
The ornamental design for a test bench, as shown and described.

FIG. 1 is a front right perspective view of a test bench;

FIG. 2 is a right elevational view thereof;

FIG. 3 is a left elevational view thereof;

FIG. 4 is a front elevational view thereof;

FIG. 5 is a rear elevational view thereof;

FIG. 6 is a top plan view thereof; and,

FIG. 7 is a bottom plan view thereof.

Haack, Ingo

Patent Priority Assignee Title
10525750, Sep 20 2013 Veltek Associates, Inc. Portable cleanroom printing cabinet
11584146, Sep 20 2013 Veltek Associates, Inc. Printing cabinet
D822102, Sep 20 2013 VELTEK ASSOCIATES, INC Portable cleanroom printing cabinet
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ER7888,
ER8214,
ER9541,
ER9850,
Patent Priority Assignee Title
6405610, Nov 14 1995 Nikon Corporation Wafer inspection apparatus
D299345, Jan 17 1986 International Business Machines Corp. Automotive test terminal
D349464, Oct 28 1992 Hitachi Construction Machinery Co., Ltd. Ultrasonic flaw detector system
D350490, Oct 08 1992 TOKYO ELELCTRON KABUSHIKI KAISHA Semiconductor wafer testing apparatus
D358105, Feb 28 1994 ON-SITE ANALYSIS, INC On-site oil analyzing apparatus
D366625, Feb 02 1994 Thermo Jarrell Ash Corporation Oil analysis apparatus
D383683, Apr 25 1996 Tokyo Electron Limited Wafer prober
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May 21 2010HAACK, INGORobert Bosch GmbHASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0244390928 pdf
May 26 2010Robert Bosch GmbH(assignment on the face of the patent)
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