Patent
   D447967
Priority
Nov 08 2000
Filed
Nov 08 2000
Issued
Sep 18 2001
Expiry
Sep 18 2015
Assg.orig
Entity
unknown
6
1
n/a
The ornamental design for a measuring apparatus for measuring a particle size distribution, as shown and described.

FIG. 1 is a front view of a measuring apparatus for measuring a particle size distribution showing our new design;

FIG. 2 is a rear view thereof;

FIG. 3 is a left side view thereof;

FIG. 4 is a right side view thereof;

FIG. 5 is a top plan view thereof; and,

FIG. 6 is a bottom plan view thereof.

Terada, Koji, Takarada, Kaoru, Inami, Kenichi

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Patent Priority Assignee Title
6191853, Sep 29 1998 Horiba Ltd Apparatus for measuring particle size distribution and method for analyzing particle size distribution
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Executed onAssignorAssigneeConveyanceFrameReelDoc
Nov 08 2000Sysmex Corporation(assignment on the face of the patent)
Dec 18 2000TERADA, KOJISysmex CorporationASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0113860067 pdf
Dec 18 2000TAKARADA, KAORUSysmex CorporationASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0113860067 pdf
Dec 18 2000INAMI, KENICHISysmex CorporationASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0113860067 pdf
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