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The ornamental design for a measuring apparatus for measuring a particle size distribution, as shown and described. |
FIG. 1 is a front view of a measuring apparatus for measuring a particle size distribution showing our new design;
FIG. 2 is a rear view thereof;
FIG. 3 is a left side view thereof;
FIG. 4 is a right side view thereof;
FIG. 5 is a top plan view thereof; and,
FIG. 6 is a bottom plan view thereof.
Terada, Koji, Takarada, Kaoru, Inami, Kenichi
Patent | Priority | Assignee | Title |
D637098, | Oct 30 2009 | HITACHI HIGH-TECH CORPORATION | Semiconductor testing machine |
D989144, | May 14 2021 | HITACHI HIGH-TECH CORPORATION | Apparatus for evaluating semiconductor substrate |
D989830, | May 14 2021 | HITACHI HIGH-TECH CORPORATION | Semiconductor substrate transfer apparatus |
D989831, | May 14 2021 | HITACHI HIGH-TECH CORPORATION | Apparatus for evaluating semiconductor substrate |
ER7490, | |||
ER8606, |
Patent | Priority | Assignee | Title |
6191853, | Sep 29 1998 | Horiba Ltd | Apparatus for measuring particle size distribution and method for analyzing particle size distribution |
Executed on | Assignor | Assignee | Conveyance | Frame | Reel | Doc |
Nov 08 2000 | Sysmex Corporation | (assignment on the face of the patent) | / | |||
Dec 18 2000 | TERADA, KOJI | Sysmex Corporation | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 011386 | /0067 | |
Dec 18 2000 | TAKARADA, KAORU | Sysmex Corporation | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 011386 | /0067 | |
Dec 18 2000 | INAMI, KENICHI | Sysmex Corporation | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 011386 | /0067 |
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