Patent
   D522977
Priority
Aug 31 2004
Filed
Dec 16 2004
Issued
Jun 13 2006
Expiry
Jun 13 2020
Assg.orig
Entity
unknown
2
8
n/a
The ornamental design for a socket for semiconductor device, as shown and described.

FIG. 1 is a left-perspective view of a socket for semiconductor device showing my new design;

FIG. 2 is a front elevational view of my new design, the rear elevational view being a mirror image thereof;

FIG. 3 is a top plan view of my new design;

FIG. 4 is a bottom plan view of my new design;

FIG. 5 is a right-side view of my new design, the left-side view being a mirror image thereof;

FIG. 6 a bottom plan view of my new design with the cross section indicated at 7—7; and,

FIG. 7 is a cross sectional view of my new design taken along line 7—7 in FIG. 6.

Sato, Masaru

Patent Priority Assignee Title
D788722, Jul 17 2014 Advantest Corporation Socket for an electronic device testing apparatus
D819581, Jul 17 2014 Advantest Corporation Socket for electronic device testing apparatus
Patent Priority Assignee Title
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D395423, Mar 13 1997 Sony Corporation Semiconductor package
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Executed onAssignorAssigneeConveyanceFrameReelDoc
Dec 08 2004SATO, MASARUYAMAICHI ELECRONICS CO , LTD ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0162580952 pdf
Dec 16 2004Yamaichi Electronics Co., Ltd.(assignment on the face of the patent)
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