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The ornamental design for a socket for an electronic device testing apparatus, as shown and described.
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The even dashed broken lines shown in the drawings represent portions of the socket for an electronic testing apparatus, that form no part of the claimed design.
The dashed-dot line shown on the top and bottom of the socket for an electronic testing apparatus represents the boundary line between the claimed and unclaimed surface areas.
The outer boarder of the center broken line circles in
Kawashima, Takashi, Aizawa, Mitsunori, Okushi, Takeshi, Nagashima, Masanori
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Executed on | Assignor | Assignee | Conveyance | Frame | Reel | Doc |
Apr 21 2017 | Advantest Corporation | (assignment on the face of the patent) | / | |||
Nov 12 2018 | Advantest Corporation | Advantest Corporation | CHANGE OF ADDRESS | 047987 | /0626 |
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