Socket for an electronic device testing apparatus

Abstract

Description

FIG. 1 is a front view of a socket for an electronic device testing apparatus showing our new design;

FIG. 2 is a rear view thereof;

FIG. 3 is a top plan view thereof;

FIG. 4 is a bottom plan view thereof;

FIG. 5 is a right side view thereof;

FIG. 6 is a left side view thereof;

FIG. 7 is a top perspective view thereof;

FIG. 8 is a bottom perspective view thereof;

FIG. 9 is a cross-sectional view taken along line 9-9 of FIG. 3;

FIG. 10 is a cross-sectional view taken along line 10-10 of FIG. 3;

FIG. 11 is an enlarged view of part 11-11 of FIGS. 9; and,

FIG. 12 is an enlarged view of part 12-12 of FIG. 10.

The part represented by solid lines is a part of the claimed design. The dot-dash broken lines (the alternate long and short dash lines) represent only a border between the part of the claimed design and other part. The dashed broken lines (the broken lines) are for illustrative purposes only and form no part of the claimed design.

The broken lines connecting the arrows in FIG. 3 which show the cut of the plane for FIGS. 9 and 10 form no part of the claimed design.

Claims

The ornamental design for a socket for an electronic device testing apparatus, as shown and described.