FIG. 1 is a front elevation view of a roller for semiconductor wafer cleaning showing my new design;
FIG. 2 is a rear elevation view thereof;
FIG. 3 is a top plan view thereof; the bottom view being an identical,
FIG. 4 is a right side view thereof; the left side view being an identical; and,
FIG. 5 is a cross section view taken along the line of 5-5 of FIG. 4 thereof.
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