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Patent
D806892
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Priority
Jun 18 2014
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Filed
Jun 18 2014
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Issued
Jan 02 2018
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Expiry
Jan 02 2032
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Assg.orig
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Entity
unknown
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20
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12
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n/a
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We claim the ornamental design for the tip of a sample holder, as shown and described.
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FIG. 1 is a perspective view of the tip of the sample holder of the invention.
FIG. 2 is a top plan view of the tip of the sample holder of FIG. 1.
FIG. 3 is a bottom view of the tip of the sample holder of FIG. 1.
FIG. 4 is a side view of the tip of the sample holder of FIG. 1.
FIG. 5 is another side view of the tip of the sample holder of FIG. 1; and,
FIG. 6 is a front view of the tip of the sample holder of FIG. 1.
Walden, II, Franklin Stampley, Damiano, Jr., John, Gardiner, Daniel Stephen, Nackashi, David P.
Patent |
Priority |
Assignee |
Title |
D841183, |
Mar 08 2016 |
PROTOCHIPS, INC |
Window E-chip for an electron microscope |
D867612, |
Jan 19 2018 |
Hamamatsu Photonics K.K. |
Sample holder for ionized sample analysis |
D867613, |
Jan 19 2018 |
Hamamatsu Photonics K.K. |
Sample holder for ionized sample analysis |
D887576, |
Jan 19 2018 |
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D891635, |
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D893742, |
Jan 19 2018 |
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D893746, |
Jan 19 2018 |
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D894421, |
Jan 19 2018 |
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D895138, |
Jan 19 2018 |
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D895142, |
Jan 19 2018 |
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D895143, |
Jan 19 2018 |
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D895832, |
Jan 19 2018 |
Hamamatsu Photonics K.K. |
Sample holder for ionized sample analysis |
D895833, |
Jan 19 2018 |
Hamamatsu Photonics K.K. |
Sample holder for ionized sample analysis |
D895834, |
Jan 19 2018 |
Hamamatsu Photonics K.K. |
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D895835, |
Jan 19 2018 |
Hamamatsu Photonics K.K. |
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D895836, |
Jan 19 2018 |
Hamamatsu Photonics K.K. |
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D898940, |
Jan 19 2018 |
Hamamatsu Photonics K.K. |
Sample holder for ionized sample analysis |
D901715, |
Jan 19 2018 |
Hamamatsu Photonics K.K. |
Sample holder for ionized sample analysis |
D936857, |
Jan 19 2018 |
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D936858, |
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Patent |
Priority |
Assignee |
Title |
4974244, |
Aug 04 1988 |
Angelo M., Torrisi |
Sample positioning method and system for X-ray spectroscopic analysis |
5084910, |
Dec 17 1990 |
Dow Corning Corporation |
X-ray diffractometer sample holder |
5127039, |
Jan 16 1991 |
The United States of America as represented by the United States |
Sample holder for X-ray diffractometry |
5350923, |
Feb 06 1992 |
NORTEL NETWORKS UK LIMITED |
Apparatus for use with analytical measuring instruments using electromagnetic radiation analysis methods |
5359640, |
Aug 10 1993 |
Bruker AXS, Inc |
X-ray micro diffractometer sample positioner |
5367171, |
Oct 24 1991 |
Hitachi, Ltd. |
Electron microscope specimen holder |
5698856, |
Aug 05 1996 |
|
Specimen holder for electron microscope |
6968037, |
Apr 10 2002 |
Bristol-Myers Squibb Company |
High throughput X-ray diffraction filter sample holder |
7471766, |
Aug 01 2006 |
Rigaku Corporation |
X-ray diffraction apparatus |
7986005, |
Jul 27 2007 |
Infineon Technologies Austria AG |
Short circuit limiting in power semiconductor devices |
D320269, |
Dec 10 1987 |
CMB Foodcan plc |
Test strip |
D628709, |
Nov 30 2007 |
X-Ray Optical Systems, Inc. |
Sample cell for x-ray analyzer |
Executed on | Assignor | Assignee | Conveyance | Frame | Reel | Doc |
Jun 18 2014 | | Protochips, Inc. | (assignment on the face of the patent) | | / |
Jul 16 2014 | WALDEN, FRANKLIN STAMPLEY, II | PROTOCHIPS, INC | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 033696 | /0933 |
pdf |
Jul 16 2014 | GARDINER, DANIEL STEPHEN | PROTOCHIPS, INC | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 033696 | /0933 |
pdf |
Jul 16 2014 | DAMIANO, JOHN, JR | PROTOCHIPS, INC | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 033696 | /0933 |
pdf |
Jul 16 2014 | NACKASHI, DAVID P | PROTOCHIPS, INC | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 033696 | /0933 |
pdf |
Jun 30 2016 | PROTOCHIPS, INC | SALEM INVESTMENT PARTNERS IV, LIMITED PARTNERSHIP | SECURITY INTEREST SEE DOCUMENT FOR DETAILS | 039813 | /0270 |
pdf |
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