Patent
   D901715
Priority
Jan 19 2018
Filed
Jul 18 2018
Issued
Nov 10 2020
Expiry
Nov 10 2035
Assg.orig
Entity
unknown
5
74
n/a
The ornamental design for a sample holder for ionized sample analysis, as shown and described.

FIG. 1 is a front view of a sample holder for ionized sample analysis of the first embodiment of the present invention;

FIG. 2 is a rear view thereof;

FIG. 3 is a top plan view thereof;

FIG. 4 is a bottom plan view thereof;

FIG. 5 is a right side view thereof;

FIG. 6 is a left side view thereof;

FIG. 7 is a front perspective view thereof;

FIG. 8 is a rear perspective view thereof;

FIG. 9 is an enlarged cross-sectional view along the line 9-9 in FIG. 1, in the area designated by 9′-9′ in FIG. 1;

FIG. 10 is an enlarged cross-sectional view along the line 10-10 in FIG. 1, in the area designated by 10′-10′ in FIG. 1;

FIG. 11 is an enlarged cross-sectional view along the line 11-11 in FIG. 1, in the area designated by 11′-11′ in FIG. 1;

FIG. 12 is an enlarged cross-sectional view along the line 12-12 in FIG. 1, in the area designated by 12′-12′ in FIG. 1;

FIG. 13 is an enlarged cross-sectional view along the line 13-13 in FIG. 1, in the area designated by 13′-13′ in FIG. 1;

FIG. 14 is a front view of a sample holder for ionized sample analysis of the second embodiment of the present invention;

FIG. 15 is a rear view thereof;

FIG. 16 is a top plan view thereof;

FIG. 17 is a bottom plan view thereof;

FIG. 18 is a right side view thereof;

FIG. 19 is a left side view thereof;

FIG. 20 is a front perspective view thereof;

FIG. 21 is a rear perspective view thereof;

FIG. 22 is an enlarged cross-sectional view along the line 22-22 in FIG. 14, in the area designated by 22′-22′ in FIG. 14;

FIG. 23 is an enlarged cross-sectional view along the line 23-23 in FIG. 14, in the area designated by 23′-23′ in FIG. 14;

FIG. 24 is an enlarged cross-sectional view along the line 24-24 in FIG. 14, in the area designated by 24′-24′ in FIG. 14;

FIG. 25 is an enlarged cross-sectional view along the line 25-25 in FIG. 14, in the area designated by 25′-25′ in FIG. 14; and,

FIG. 26 is an enlarged cross-sectional view along the line 26-26 in FIG. 14, in the area designated by 26′-26′ in FIG. 14.

The dash-dot-dash broken lines depict indicators for sectional views and enlarged views and depict boundaries in the enlarged sectional views and enlarged views, the dash-dot-dash broken lines form no part of the claimed design.

Kotani, Masahiro, Ohmura, Takayuki

Patent Priority Assignee Title
D936857, Jan 19 2018 Hamamatsu Photonics K.K. Sample holder for ionized sample analysis
D936858, Jan 19 2018 Hamamatsu Photonics K.K. Sample holder for ionized sample analysis
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Jul 09 2018OHMURA, TAKAYUKIHAMAMATSU PHOTONICS K K ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0463800637 pdf
Jul 09 2018KOTANI, MASAHIROHAMAMATSU PHOTONICS K K ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0463800637 pdf
Jul 18 2018Hamamatsu Photonics K.K.(assignment on the face of the patent)
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