Patent
   D867613
Priority
Jan 19 2018
Filed
Jul 18 2018
Issued
Nov 19 2019
Expiry
Nov 19 2034
Assg.orig
Entity
unknown
24
30
n/a
The ornamental design for a sample holder for ionized sample analysis, as shown and described.

FIG. 1 is a front view of a sample holder for ionized sample analysis of the present invention;

FIG. 2 is a rear view thereof;

FIG. 3 is a top plan view thereof;

FIG. 4 is a bottom plan view thereof;

FIG. 5 is a right side view thereof;

FIG. 6 is a left side view thereof;

FIG. 7 is a front perspective view thereof;

FIG. 8 is a rear perspective view thereof;

FIG. 9 is an enlarged view showing a portion of FIG. 7 defined by lines 9-9 and 9′-9′;

FIG. 10 is an enlarged view showing a portion of FIG. 7 defined by lines 10-10 and 10′-10′;

FIG. 11 is an enlarged view showing a portion of FIG. 7 defined by lines 11-11 and 11′-11′;

FIG. 12 is a cross-sectional view along the line 12-12 in FIG. 3;

FIG. 13 is a top plan view of the main body;

FIG. 14 is a cross-sectional view along the line 14-14 in FIG. 3;

FIG. 15 is a top plan view of the separator;

FIG. 16 is an enlarged cross-sectional view along the line 16-16 in FIG. 1, in the area designated by 16′-16′ in FIG. 1;

FIG. 17 is an enlarged cross-sectional view along the line 17-17 in FIG. 1, in the area designated by 17′-17′ in. FIG. 1;

FIG. 18 is an enlarged cross-sectional view along the line 18-18 in FIG. 1, in the area designated by 18′-18′ in FIG. 1;

FIG. 19 is an enlarged cross-sectional view along the line 19-19 in FIG. 1, in the area designated by 19′-19′ in FIG. 1; and,

FIG. 20 is an enlarged cross-sectional view along the line 20-20 in FIG. 1, in the area designated by 20′-20′ in FIG. 1.

The features shown in evenly-dashed broken lines depict environmental subject matter only and form no part of the claimed design. The dot-dash broken lines in the drawings represent the bounds of the claimed subject matter, the dot-dash broken lines, themselves forming no part thereof.

The portions shown in solid-broken alternated hatching lines in FIGS. 16 to 20 are transparent.

Kotani, Masahiro, Ohmura, Takayuki

Patent Priority Assignee Title
D887576, Jan 19 2018 Hamamatsu Photonics K.K. Sample holder for ionized sample analysis
D888275, Apr 27 2016 Hamamatsu Photonics K.K. Substrate for spectroscopic analysis
D888276, Apr 27 2016 Hamamatsu Photonics K.K. Substrate for spectroscopic analysis
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D891635, Jan 19 2018 Hamamatsu Photonics K.K. Sample holder for ionized sample analysis
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D895143, Jan 19 2018 Hamamatsu Photonics K.K. Sample holder for ionized sample analysis
D895832, Jan 19 2018 Hamamatsu Photonics K.K. Sample holder for ionized sample analysis
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D895834, Jan 19 2018 Hamamatsu Photonics K.K. Sample holder for ionized sample analysis
D895835, Jan 19 2018 Hamamatsu Photonics K.K. Sample holder for ionized sample analysis
D895836, Jan 19 2018 Hamamatsu Photonics K.K. Sample holder for ionized sample analysis
D898940, Jan 19 2018 Hamamatsu Photonics K.K. Sample holder for ionized sample analysis
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D903900, Apr 30 2019 RESEARCH INSTITUTE AT NATIONWIDE CHILDREN S HOSPITAL Slide holder
D936857, Jan 19 2018 Hamamatsu Photonics K.K. Sample holder for ionized sample analysis
D936858, Jan 19 2018 Hamamatsu Photonics K.K. Sample holder for ionized sample analysis
D963489, Dec 12 2020 Air sampler
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Executed onAssignorAssigneeConveyanceFrameReelDoc
Jul 09 2018OHMURA, TAKAYUKIHAMAMATSU PHOTONICS K K ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0463820462 pdf
Jul 09 2018KOTANI, MASAHIROHAMAMATSU PHOTONICS K K ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0463820462 pdf
Jul 18 2018Hamamatsu Photonics K.K.(assignment on the face of the patent)
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