Patent
   D898940
Priority
Jan 19 2018
Filed
Jul 18 2018
Issued
Oct 13 2020
Expiry
Oct 13 2035
Assg.orig
Entity
unknown
3
75
n/a
The ornamental design for a sample holder for ionized sample analysis, as shown and described.

FIG. 1 is a front view of a sample holder for ionized sample analysis of the present invention;

FIG. 2 is a rear view thereof;

FIG. 3 is a top plan view thereof;

FIG. 4 is a bottom plan view thereof;

FIG. 5 is a right side view thereof;

FIG. 6 is a left side view thereof;

FIG. 7 is a front perspective view thereof;

FIG. 8 is a rear perspective view thereof;

FIG. 9 is an enlarged view showing a portion of FIG. 1 defined by lines 9-9 and 9′-9′;

FIG. 10 is an enlarged view showing a portion of FIG. 4 defined by line 10-10;

FIG. 11 is an enlarged view showing a portion of FIG. 7 defined by lines 11-11 and 11′-11′;

FIG. 12 is an enlarged cross-sectional view along the line 12-12 in FIG. 10, in the area designated by 12′-12′ in FIG. 9;

FIG. 13 is an enlarged cross-sectional view along the line 13-13 in FIG. 10, in the area designated by 13′-13′ in FIG. 9;

FIG. 14 is an enlarged cross-sectional view along the line 14-14 in FIG. 10, in the area designated by 14′-14′ in FIG. 9; and,

FIG. 15 is an enlarged cross-sectional view along the line 15-15 in FIG. 10, in the area designated by 15′-15′ in FIG. 9.

The features shown in evenly-dashed broken lines depict portions of the sample holder for ionized sample analysis that form no part of the claimed design. The dot-dash-dot broken lines depict the boundaries of the claim and form no part thereof. The dash-dot-dot-dash broken lines depict indicators for sectional views and enlarged views and depict boundaries in the enlarged sectional views and enlarged views, the dash-dot-dot-dash broken lines form no part of the claimed design.

Kotani, Masahiro, Ohmura, Takayuki

Patent Priority Assignee Title
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D936857, Jan 19 2018 Hamamatsu Photonics K.K. Sample holder for ionized sample analysis
D936858, Jan 19 2018 Hamamatsu Photonics K.K. Sample holder for ionized sample analysis
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Jul 09 2018OHMURA, TAKAYUKIHAMAMATSU PHOTONICS K K ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0463820566 pdf
Jul 09 2018KOTANI, MASAHIROHAMAMATSU PHOTONICS K K ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0463820566 pdf
Jul 18 2018Hamamatsu Photonics K.K.(assignment on the face of the patent)
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