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Patent
   D854184
Priority
Jan 25 2017
Filed
Jul 05 2017
Issued
Jul 16 2019
Expiry
Jul 16 2034
Inventors
Shibayama,…
Assg.orig
HAMAMATSU …
Assg.curr
Hamamatsu …
Entity
unknown
Referenced by
22
References
51
Maint.:
n/a
The ornamental design for a substrate for spectroscopic analysis, as shown and described.

1. Substrate for spectroscopic analysis

1.1 : Perspective

1.2 : Front

1.3 : Back

1.4 : Top

1.5 : Bottom

1.6 : Left

1.7 : Right

1.8 : Sectional view taken along the line 1.8-1.8 of Reproduction 1.2

1.9 : Sectional view taken along the line 1.9-1.9 of Reproduction 1.2

1.10 : Perspective view without the cover part

1.11 : Reference view showing the state in use

In the Reproductions, the broken lines are for the purpose of illustrating environment only and form no part of the claimed design. The dot-dash broken lines are for the purpose of showing the boundaries of the claim and form no part of the claimed design.
INVENTORS:

Shibayama, Katsumi, Ito, Masashi, Ofuji, Kazuto, Maruyama, Yoshihiro

THIS PATENT IS REFERENCED BY THESE PATENTS:
Patent Priority Assignee Title
D867612, Jan 19 2018 Hamamatsu Photonics K.K. Sample holder for ionized sample analysis
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D887576, Jan 19 2018 Hamamatsu Photonics K.K. Sample holder for ionized sample analysis
D888982, Jan 28 2019 Quark Biosciences Taiwan, Inc. Multiplex slide plate device
D891635, Jan 19 2018 Hamamatsu Photonics K.K. Sample holder for ionized sample analysis
D893742, Jan 19 2018 Hamamatsu Photonics K.K. Sample holder for ionized sample analysis
D893746, Jan 19 2018 Hamamatsu Photonics K.K. Sample holder for ionized sample analysis
D894421, Jan 19 2018 Hamamatsu Photonics K.K. Sample holder for ionized sample analysis
D895138, Jan 19 2018 Hamamatsu Photonics K.K. Sample holder for ionized sample analysis
D895142, Jan 19 2018 Hamamatsu Photonics K.K. Sample holder for ionized sample analysis
D895143, Jan 19 2018 Hamamatsu Photonics K.K. Sample holder for ionized sample analysis
D895832, Jan 19 2018 Hamamatsu Photonics K.K. Sample holder for ionized sample analysis
D895833, Jan 19 2018 Hamamatsu Photonics K.K. Sample holder for ionized sample analysis
D895834, Jan 19 2018 Hamamatsu Photonics K.K. Sample holder for ionized sample analysis
D895835, Jan 19 2018 Hamamatsu Photonics K.K. Sample holder for ionized sample analysis
D895836, Jan 19 2018 Hamamatsu Photonics K.K. Sample holder for ionized sample analysis
D898940, Jan 19 2018 Hamamatsu Photonics K.K. Sample holder for ionized sample analysis
D901715, Jan 19 2018 Hamamatsu Photonics K.K. Sample holder for ionized sample analysis
D904640, Jan 21 2019 Applied Materials, Inc Substrate carrier
D907243, Jan 24 2018 KIKOH CORPORATION Device for biological or biochemical analysis
D936857, Jan 19 2018 Hamamatsu Photonics K.K. Sample holder for ionized sample analysis
D936858, Jan 19 2018 Hamamatsu Photonics K.K. Sample holder for ionized sample analysis
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ASSIGNMENT RECORDS    Assignment records on the USPTO
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Executed onAssignorAssigneeConveyanceFrameReelDoc
Jun 15 2017ITO, MASASHIHAMAMATSU PHOTONICS K K ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0446080629 pdf
Jun 15 2017SHIBAYAMA, KATSUMIHAMAMATSU PHOTONICS K K ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0446080629 pdf
Jun 15 2017OFUJI, KAZUTOHAMAMATSU PHOTONICS K K ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0446080629 pdf
Jun 19 2017MARUYAMA, YOSHIHIROHAMAMATSU PHOTONICS K K ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0446080629 pdf
Jul 05 2017Hamamatsu Photonics K.K.(assignment on the face of the patent)
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