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Patent
   D320361
Priority
Jun 02 1989
Filed
Jun 02 1989
Issued
Oct 01 1991
Expiry
Oct 01 2005
Inventors
Karasawa, …
Assg.orig
Tokyo Elec…
Assg.curr
Tokyo Elec…
Entity
unknown
Referenced by
26
References
7
Maint.:
n/a
The ornamental design for a wafer probe plate holder, as shown and described.

FIG. 1 is a front elevational view of a wafer probe plate holder showing my new design, the rear, right and left side elevational views being identical;

FIG. 2 is a top plan view;

FIG. 3 is a bottom plan view; and

FIG. 4 is a cross sectional view thereof taken along line 4-4' of FIG. 2 thereof.
INVENTORS:

Karasawa, Wataru

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THIS PATENT REFERENCES THESE PATENTS:
Patent Priority Assignee Title
4219771, Feb 21 1978 Texas Instruments Incorporated Four-quadrant, multiprobe-edge sensor for semiconductor wafer probing
4649338, Feb 28 1980 Hughes Missile Systems Company Fine line circuitry probes and method of manufacture
4649339, Apr 25 1984 Atmel Corporation Integrated circuit interface
4755747, Jun 15 1984 Canon Kabushiki Kaisha Wafer prober and a probe card to be used therewith
4853627, Dec 23 1985 TriQuint Semiconductor, Inc. Wafer probes
4862077, Apr 29 1987 International Business Machines Corporation Probe card apparatus and method of providing same with reconfigurable probe card circuitry
4961052, Jan 07 1989 Mitsubishi Denki Kabushiki Kaisha Probing plate for wafer testing
ASSIGNMENT RECORDS    Assignment records on the USPTO
//
Executed onAssignorAssigneeConveyanceFrameReelDoc
May 16 1989KARASAWA, WATARUTokyo Electron LimitedASSIGNMENT OF ASSIGNORS INTEREST 0057740871 pdf
Jun 02 1989Tokyo Electron Limited(assignment on the face of the patent)
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