FIG. 1 is a top perspective view a first embodiment of an elastic membrane for semiconductor wafer polishing apparatus showing our new design;
FIG. 2 is a bottom perspective view thereof;
FIG. 3 is a top plan view thereof;
FIG. 4 is a bottom plan view thereof;
FIG. 5 is a side view thereof, with the apparatus being radially symmetrical about a vertical axis;
FIG. 6 is a cross sectional view taken along section line 6-6 in FIG. 3;
FIG. 7 is an enlarged portion view taken along line 7-7 in FIG. 6;
FIG. 8 is a top perspective view a second embodiment of an elastic membrane for semiconductor wafer polishing apparatus showing our new design;
FIG. 9 is a bottom perspective view thereof;
FIG. 10 is a top plan view thereof;
FIG. 11 is a bottom plan view thereof;
FIG. 12 is a side view thereof, with the apparatus being radially symmetrical about a vertical axis;
FIG. 13 is a cross sectional view taken along section line 13-13 in FIG. 10;
FIG. 14 is an enlarged portion view taken along line 14-14 in FIG. 13;
FIG. 15 is a top perspective view a third embodiment of an elastic membrane for semiconductor wafer polishing apparatus showing our new design;
FIG. 16 is a bottom perspective view thereof;
FIG. 17 is a top plan view thereof;
FIG. 18 is a bottom plan view thereof;
FIG. 19 is a side view thereof, the apparatus being radially symmetrical about a vertical axis;
FIG. 20 is a cross sectional view taken along section line 20-20 in FIG. 17;
FIG. 21 is an enlarged portion view taken along line 21-21 in FIG. 20;
FIG. 22 is a top perspective view a fourth embodiment of an elastic membrane for semiconductor wafer polishing apparatus showing our new design;
FIG. 23 is a bottom perspective view thereof;
FIG. 24 is a top plan view thereof;
FIG. 25 is a bottom plan view thereof;
FIG. 26 is a side view thereof, the apparatus being radially symmetrical about a vertical axis;
FIG. 27 is a cross sectional view taken along line 27-27 in FIG. 24; and,
FIG. 28 is an enlarged portion view taken along line 28-28 in FIG. 27.
The broken lines shown in the drawings represent portions of the elastic membrane for semiconductor wafer polishing apparatus that form no part of the claimed design.
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